'); } else { var query = elem.find('.keywords').html(); $.ajax({ context: elem, url: 'https://wn.com/api/upge/cheetah-search-adv/video', cache: true, data: { 'query': query }, dataType: 'jsonp', success: function(text) { if (text.length > 0) { video_id = text[0].id; elem.find('.player').html(''); } } }); } } var stopAllYouTubeVideos = function() { var iframes = document.querySelectorAll('iframe'); Array.prototype.forEach.call(iframes, function(iframe) { iframe.contentWindow.postMessage(JSON.stringify({ event: 'command', func: 'pauseVideo' }), '*'); }); } jQuery(function() { jQuery(".playVideo").live("click", function() { if(!$(this).hasClass("played")){ stopAllYouTubeVideos(); var elem = $(this); setTimeout(function(){ mouseOverMe(elem); }, 1000); } }); jQuery(".description_box .expandContent").live("click", function() { elem = $(this).parent().parent().parent().find('.descContent'); if(elem.height() > 51) { elem.css('height', '44px'); $(this).html('Show More '); }else{ elem.css('height', 'auto'); $(this).html('Hide '); } }); jQuery('.interview-play-off').click(function() { $(".interview-play-off").hide(); $(".interview-play").show(); $(".videoplayer-control-pause").click(); }); jQuery(".video-desc .show_author_videos").live("click", function() { query = $(this).attr('title'); container = $(this).parent().parent().parent().find('.video-author-thumbs'); $(this).parent().parent().parent().find('.video-author-thumbs').css('height', '220px'); jQuery.ajax({ url: '/api/upge/cheetah-photo-search/videoresults', data: {'query': query}, success: function(text) { if(!text) { text = i18n("No results"); } container.html(jQuery(text)); } }); }); }); // -->

Latest News for: JEOL

Edit

Automation of High‑Magnification Observation of NMC Cathode Active Material Particles Using an SEM External Control API and Python® [Application Notes] (Jeol Ltd)

Public Technologies 26 Mar 2026
) Introduction ... However, operators must manually measure large numbers of NMC particles and observe their surfaces at high magnification with scanning electron microscopes (SEMs), which requires significant time and effort ... Carbon paste ... Jeol Ltd.
Edit

Difference analysis of pyrolysis oil using the blank tube FI method and msRepeatFinder [Application Notes] (Jeol Ltd)

Public Technologies 23 Mar 2026
) Introduction. The blank-tube FI (Field Ionization) method introduces a sample into the GC inlet, passes it through a blank tube, and detects it by FI soft ionization ... The results obtained from difference analysis are introduced ... Energy ... 517 ... Jeol Ltd.
Edit

Our paper has been published in the "Plant Methods" (Jeol Ltd)

Public Technologies 19 Mar 2026
A joint research team by Tokyo University of Agriculture and Technology, the University of Tokyo, and JEOL Ltd., has developed a new technique enabling the observation of Cortical ... Jeol Ltd.
Edit

Hydrocarbon oil type analysis using the blank tube FI method and msRepeatFinder [Application Notes] (Jeol Ltd)

Public Technologies 17 Mar 2026
) Introduction. The blank-tube FI (Field Ionization) method introduces a sample into the GC inlet, passes it through a blank tube, and detects it by FI soft ionization. This method enables detection of molecular ions in less than one minute ... Jeol Ltd.
Edit

SB-89010EUVC EXCIMER UV CLEANER(FOR WAFER)– Product Details Published (Jeol Ltd)

Public Technologies 16 Mar 2026
). 6 inch wafer loadable. Wafer surface cleaning before resist coating. Removal of organic matter from wafer surface. Improve adhesion between resist and wafer (*depending on the type of resist or developer, adhesion may not improve) ...Note ... Jeol Ltd.
Edit

Research from the University of Tokyo using the JEOL GRAND ARM™ electron microscope has been published in “Nature Communications” (Jeol Ltd)

Public Technologies 11 Mar 2026
). Release Date ... A research group from the University of Tokyo published the results of three-dimensional structural analysis using JEOL's GRAND ARM™electron microscope in "Nature Communications" ... Related Products ... Jeol Ltd.
Edit

3D NAND TEM Specimen Preparation by FIB-SEM [Application Notes] (Jeol Ltd)

Public Technologies 05 Mar 2026
) Introduction. FIB-SEM is a system integrating fine processing by using a Ga ion beam and observation & analysis function by SEM ... 3D NAND is a NAND type flash memory and is widely adopted in the storage device of a smartphone and PC ... Jeol Ltd.
Edit

Observation of internal structure of jewel beetle ~Identification of specific part using μCT, specimen preparation, SEM observation~ [Application Notes] (Jeol Ltd)

Public Technologies 03 Mar 2026
). µCT is a non-destructive method to confirm the muscles and internal organs of insects. In this study, we used µCT to identify the high-density area inside a jewel beetle specimen from the transmission image ... Fig.2 µCT gray scale 3D image ... Jeol Ltd.
Edit

Introduction of linkage holder facilitating air-isolation observation & analysis [Application Notes] (Jeol Ltd)

Public Technologies 03 Mar 2026
) Introduction. For the observation and analysis of highly active materials, such as battery materials, a mechanism is required to avoid atmosphere and moisture ... Specimen Preparation Flow under Air-isolated Environment ... Existing Issues ... Summary ... Jeol Ltd.
Edit

AccuTOF™ GC series GCxGC Applications Notebook - Edition February 2026 [Application Notes] (Jeol Ltd)

Public Technologies 26 Feb 2026
For the past two decades, JEOL has steadily advanced GCxGC (comprehensive two-dimensional gas chromatography) applications ... 3 (released August 2025) brings JEOL's distinctive AI Structural Analysis capability to GCxGC data ... Jeol Ltd.
Edit

AccuTOF™ GC series Food, Flavor, Fragrance & Metabolomics Applications Notebook - Edition Februaly 2026 [Application Notes] (Jeol Ltd)

Public Technologies 26 Feb 2026
msFineAnalysis AI Novel Qualitative Analysis Software for JMS-T2000GC with AI Structural Analysis (Kubo, A., JEOL news, 58, 53 - 61, 2023) ... (Ubukata, M., JEOL news, 56, 66 - 72, 2021) ... Jeol Ltd.
×